A comprehensive set of physical models allows for simulating various kinds of advanced
device structures, such as present-day CMOS devices, silicon-on-insulator (SOI) devices,
and hetero-structure devices. Taking into account the atomistic nature of traps and dopants,
Minimos-NT provides reliability and variability modeling of highly scaled transistors such
as bulk planar devices and silicon-on-insulator FinFETs having a channel length of 22nm
or less.