In ultrasonic transceiver systems, both the excitation
conditions and the electrical parameters of the reception
stage significantly influence the characteristics of timedomain responses [1,2]. This occurs at a double level
because driving and received signals are separately
affected in distinct phases of the E/R process. Therefore,
the effects of this combined influence on the final timeresponse registered in reception are cumulative and can
become very important.
In the practice of NDE, multiple interferences from
neighbouring flaws could hide some testing indications.
This is avoided by using intense and very short testing
pulses. These efficiency and frequency-band requirements are achieved by combining, in the excitation stage,
efficient high-voltage step sources with coupling networks designed for each ultrasonic emitter. This type of
circuit incorporates various non-linear devices such as
diode networks and high-voltage switching devices.
Strong interactions can arise between these electronic