The pH of the medium remained constant during the
experiments, varying from 6.0 at the beginning to 5.6, on
average n (Fig. 2). The pH has also been described as a factor
that strongly interferes in the fermentative processes.
However, according to Diez and Yokoya (1996b) molasses
exhibits a buffering effect. This regulatory action depends
The fairly recent availability of commercial focused ion beam (FIB) microscopes has
led to rapid development of their applications for materials science. FIB instruments
have both imaging and micromachining capabilities at the nanometer–micrometer scale;
thus, a broad range of fundamental studies and technological applications have been
enhanced or made possible with FIB technology. This introductory article covers the
basic FIB instrument and the fundamentals of ion–solid interactions that lead to the
many unique FIB capabilities as well as some of the unwanted artifacts associated with
FIB instruments. The four topical articles following this introduction give overviews of
specific applications of the FIB in materials science, focusing on its particular strengths
as a tool for characterization and transmission electron microscopy sample preparation,
as well as its potential for ion beam fabrication and prototyping.
The pH of the medium remained constant during theexperiments, varying from 6.0 at the beginning to 5.6, onaverage n (Fig. 2). The pH has also been described as a factorthat strongly interferes in the fermentative processes.However, according to Diez and Yokoya (1996b) molassesexhibits a buffering effect. This regulatory action dependsThe fairly recent availability of commercial focused ion beam (FIB) microscopes hasled to rapid development of their applications for materials science. FIB instrumentshave both imaging and micromachining capabilities at the nanometer–micrometer scale;thus, a broad range of fundamental studies and technological applications have beenenhanced or made possible with FIB technology. This introductory article covers thebasic FIB instrument and the fundamentals of ion–solid interactions that lead to themany unique FIB capabilities as well as some of the unwanted artifacts associated withFIB instruments. The four topical articles following this introduction give overviews ofspecific applications of the FIB in materials science, focusing on its particular strengthsas a tool for characterization and transmission electron microscopy sample preparation,as well as its potential for ion beam fabrication and prototyping.
การแปล กรุณารอสักครู่..