This paper focuses on the comparison of Ti-precursors and oxidants.
Regarding the growth of TiO2, here only growth rates are compared.
Microstructural investigations are conducted for post deposition
annealing and in-situ crystallization XRD studies.
A systematic study of the layermicrostructure of TiO2 films as deposited
from TDMAT and H2O ALD has not been published yet. Hence, this
work presents the systematic investigation of deposition temperatures
and resulting layer microstructure. Based on the experimental results,
possible interaction mechanisms of TDMAT and H2O precursor molecules
and the TiO2 surface at different temperatures.
Also, the high temperature deposition of TiO2 from TDMAT and H2O
is examined with the aim to use this process for the ALD of ternary titanates
such as SrTiO3 or BaTiO3 which use a Ba- or Sr- cyclopentadienyl
precursor and require deposition temperatures exceeding 250 °C
[21,22]. Therefore, we focus on the range of deposition temperatures
of 250 °C and above.