Powder X-ray diffraction patterns were obtained with a Philips
X’PERT diffractometer (Cu KR radiation, 2 kW, with an X’Celerator
RTMS detector, automatic divergence slit). The powder was
measured on a Si single crystal and sealed in the glovebox by an
airtight hood made of Kapton foil, the foil being mounted out of
the focus of the spectrometer. The software for data acquisition
and evaluation was X’PERT 1.3e and ProFit 1.0c. PowderCell Vers.
2.4 was used to calculate the powder diffraction pattern of
Ca(AlH4)2â4THF from the single-crystal data.