3.1.2. X-raydiffraction
X-ray diffraction technique was used to determine the crys- tallinity of impregnated and fresh samples. The XRD patterns of the parent (ZX) and MEA-modified zeolite (ZX10) are shown in Fig. 2. The reflection lines are well resolved and it can be seen
Fig. 2. XRD patterns of the zeolite before and after modifiers loading MEA with intensity in relative unit.
that the location of the reflection lines remains constant, indicat- ing that the structure of zeolite 13X was well preserved even with the highest load of MEA. Sample ZX10 was chosen because it was the most intensely affected sample in terms of its textural charac- teristics. Nevertheless, the crystalline zeolitic structure remained nearly intact, which suggests that the impregnation procedure did not affect the crystallinity of any of the other impregnated samples.