Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become
an increasing limitation of the reliability of electronic components, circuits, and
systems, and have stimulated abundant past and undergoing work for improving our
understanding and developing mitigation techniques. Therefore, compiling the
knowledge cumulated in an abundant literature, and reporting the open issues and
ongoing efforts, is a challenging task. Such a tentative should start by discussing the
fundamental aspects of SEEs before reviewing the different steps that are necessary
for creating comprehensive prediction models and developing efficient mitigation
techniques.
Single Event Effects (SEEs) induced by heavy ions, protons, and neutrons become
an increasing limitation of the reliability of electronic components, circuits, and
systems, and have stimulated abundant past and undergoing work for improving our
understanding and developing mitigation techniques. Therefore, compiling the
knowledge cumulated in an abundant literature, and reporting the open issues and
ongoing efforts, is a challenging task. Such a tentative should start by discussing the
fundamental aspects of SEEs before reviewing the different steps that are necessary
for creating comprehensive prediction models and developing efficient mitigation
techniques.
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