Fig. 6shows the XRD patterns for the frits heat treated at 10001C. The diffraction peaks corresponding to pseudowollastonite (α-CaSiO3) and wollastonite are present for both frits PF and CF. However, the pseudowollastonite peaks are more pronounced for frit PF, and the wollastonite peaks are stronger for frit CF. The temperature effect on the peaks intensity in the crystallographic plane QUOTE (2θ¼27.51) related to pseudowollastonite and in the plane (320) (2θ¼301) related to wollastonite is shown inFig. 7 for frit PF and frit CF.