This shows that in our work, the increase of seed layer thickness
does not influence the length of nanorods very much.
The XRD results for 20,40,160 and 320 nm thicknesses of seed
layers are shown in Fig. 2. As can be seen, with increase of seed
layer thickness, the (002) intensity increases; so that maximum
intensity is observed on the sample with 320 nm thickness.
These results reveal that the degree of crystallinity of the seed
layer increases with increase in the thickness.
Table 2 shows full-width at half maximum (FWHM) of XRD
peaks and the grain size of the seed layer for different thicknesses
using Scherrer’s formula: