The full width at half-maximum and

The full width at half-maximum and intensity of the peaks was
monitored to evaluate the crystalline quality of the Sn–ZnO films
(see Table 1). From the Fig. 1a it can be noticed that for low concentration
(up to 1 wt.%) the film exhibited a strong orientation towards
(002) plane or c-axis, whereas for higher doping the c-axis
orientation gets reduced.