2.1.2. Scanning electron microscopy
For the scanning electron microscopy, cleaned and dried with Critical Point Dryer (Polaron, CDP 7501) specimens were mounted by double sided tape onSEMstubs and coated with gold in a Polaron SC 502 sputter coater, then examined with JEOL JSM 6060 scanning
electron microscope at accelerating voltage 10–15 kV. Photos were taken by digitally in SEM.